Instrumental Function

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Preferred Orientation Calculation Control Result Output BGMN Variables
X-ray diffraction patterns consist of a number of Bragg-reflections, which in common are individually broadened. This broadening is caused by three reasons: BGMN separates the first two topics from the Rietveld refinement. The wavelength distribution is predetermined (as file) and for a given device setup an instrumental geometric profile has to be calculated once.

BGMN enables two different sources for the geometric part:

Both ways uses identic mathematic profile description. The main difference: For raytraced profiles, no measuring or an half hour tube tails measurement is needed. Learnt profiles demand for a multiple day standard measurement.